Optical identification using imperfections in 2D materials

Сентябрь 14, 2022

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Optical identification using imperfections in 2D materials

Содержание

2. Introduction The ability to uniquely identify an object or device is important for authentication. Imperfections, locked
4. Objective To analise a proposed simple optical technique to read unique information from nanometer-scale defects in
5. Tasks Method Results for WS2 from mechanically exfoliation Results for WS2 from chemical vapor deposition Conclusion
6. Method Measurement apparatus, in which the photoluminescence from a monolayer TMD is collected by an objective
7. Angular orientations of the BPF determines the center-wavelength of its pass band, which varies with incidence
8. Concept of the angular selective transmission Changing the BPF angle lights up a random subset of
9. Makeup of PUF The BPF angular orientation θ, the corresponding BPF bandwidth, and the spatially varying
10. Results for WS2 from mechanically exfoliation 50× Optical image of the exfoliated flake on PDMS. μ-PL
11. Results for WS2 from chemical vapor deposition Angular-dependent PL images of monolayer flake, excited by 450
12. Angular dependent PL images of WS2 monolayer flake, excited by 450 nm laser, imaged by a
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Слайд 2

Introduction
The ability to uniquely identify an object or device is important

for authentication. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce.

Слайд 3

Слайд 4

Objective
To analise a proposed simple optical technique to read unique information from

nanometer-scale defects in 2D materials.

Слайд 5

Tasks
Method
Results for WS2 from mechanically exfoliation
Results for WS2 from chemical vapor

deposition
Conclusion

Слайд 6

Method
Measurement apparatus, in which the photoluminescence from a monolayer TMD is

collected by an objective lens (OL), selectively transmitted through a rotatable optical bandpass filter (BPF), finally imaged on a CCD sensor.

Слайд 7

Angular orientations of the BPF determines the center-wavelength of its pass

band, which varies with incidence angle

Слайд 8

Concept of the angular selective transmission
Changing the BPF angle lights up

a random subset of pixels on the CCD; red, green and blue conceptually correspond to positions on the monolayer TMD that emits in differing energy ranges. When no filter is present, all energies are picked up.

Слайд 9

Makeup of PUF
The BPF angular orientation θ, the corresponding BPF bandwidth, and

the spatially varying photoluminescence of the monolayer TMD PL makes up the physical unclonable function.

Слайд 10

Results for WS2 from mechanically exfoliation
50× Optical image of the exfoliated flake

on PDMS. μ-PL map of this flake was recorded with 532 nm excitation and 100 μW excitation power at 300 K. The integration time for each pixel is 0.5 s.

Слайд 11

Results for WS2 from chemical vapor deposition
Angular-dependent PL images of monolayer flake,

excited by 450 nm laser, collected using 50× (a)–(c) and 10× (d)–(f) respectively.

Слайд 12

Angular dependent PL images of WS2 monolayer flake, excited by 450 nm

laser, imaged by a 10× objective lens

Optical identification using imperfections in 2D materials

Содержание

IntroductionThe ability to uniquely identify an object or device is important

ObjectiveTo analise a proposed simple optical technique to read unique information from

TasksMethodResults for WS2 from mechanically exfoliationResults for WS2 from chemical vapor

MethodMeasurement apparatus, in which the photoluminescence from a monolayer TMD is

Angular orientations of the BPF determines the center-wavelength of its pass

Concept of the angular selective transmissionChanging the BPF angle lights up

Makeup of PUFThe BPF angular orientation θ, the corresponding BPF bandwidth, and

Results for WS2 from mechanically exfoliation 50× Optical image of the exfoliated flake

Results for WS2 from chemical vapor depositionAngular-dependent PL images of monolayer flake,