Содержание
- 2. In uniform isotropic linear media, the wave equation is: They are satisfied by plane wave ψ=A
- 3. We can define the index of refraction as Most media are nonmagnetic and have a magnetic
- 4. Let the electric field of optical wave in an atom be E=E0e-iωt the electron obeys the
- 5. The solution is The induced dipole moment is α is atomic polarizability The dielectric constant of
- 6. If the second term is small enough then The dielectric constant of the medium is given
- 7. The complex refractive index is Normalized plot of n-1 and k versus ω−ω0 at ω ~ω0
- 8. For more than one resonance frequencies for each atom, Classical Electron Model ( Drude model) If
- 9. By definition, We can easily get: Relation Between Dielectric Constant and Refractive Index
- 10. Real and imaginary part of the index of refraction of GaN vs. energy; An Example to
- 11. The real part and imaginary part of the complex dielectric function ε (ω) are not independent.
- 12. Typical experimental setup ( 1) halogen lamp; (2) mono-chromator; (3) chopper; (4) filter; (5) polarizer (get
- 13. Snell Law become: Reflection of p-polarized light Reflection coefficient: In this case, n1=1, and n2=nr+i n
- 14. Results Based on Reflection Measurement FIG. 2. Measured refractive indices at 300 K vs. photon energy
- 15. Use AFM to Determine the Refractive Index Profiles of Optical Fibers Fiber samples were Cleaved and
- 16. The optical lever operates by reflecting a laser beam off the cantilever. Angular deflection of the
- 17. Result
- 18. For θ=0, input wave function a e iφ , tm=aTT’R’2m-1 e i(φ-(2m-1)δ ) (m=1,2…) δ=2πdn/λ The
- 19. Result Based on Transmission Measurement
- 20. Application In our lab., we have a simple system to measure the thickness of epitaxial GaN
- 21. n(λm)=m λm/2d Thickness Measurement Steps to calculate thickness Get peak position λm d=(λm λm-1)/2/[λm-1 n(λm) −
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